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Global Test Solution Provider

我们将引领半导体测试装
备的韩国国产化。

i1000 Series
i1000 Series

主要特点

  • DDR4,5 Module Full Function Test 및 DC Test 支援
  • TOF Function 최대 200MHz Test (Cell & Core Test)
  • Per Site Operation Testing
  • Auto Calibration 支援
  • SPD Function 支援
  • Cycle Pallet All Pin 支援

基本规格

  • Test DeviceDDR4,5 Module / RDIMM, UDIMM, SODIMM
  • Max Frequency1200MHz/2400Mbps
  • Parallelism16para Multi-Site/Station
  • Digital Unit2944Ch/System【内置Per pin PMU】
  • Power UnitPPS - 640Ch/System, VPMIC - 16Ch/System (High Voltage & High Current)
  • Cooling MethodLiquid cooing
  • Operating SystemLinux
거래처
DDR4,5 Module Full Function Test 및 DC Test 支援
TOF Function 최대 200MHz Test (Cell & Core Test)
Per Site Operation Testing
Auto Calibration 支援
SPD Function 支援
Cycle Pallet All Pin 支援
i7000 Series
i7000 Series

主要特点

  • DDR4,5 Component Full Function Test 및 DC Test 志愿
  • TOF Function 최대 200MHz Test (Cell & Core Test)
  • Per Site Operation Testing
  • Auto Calibration 志愿
  • Cycle Pallet All Pin 志愿

基本规格

  • Test DeviceDDR4,5 Component
  • Max Frequency1200MHz/2400Mbps
  • Parallelism512para/Station
  • Digital Unit5888Ch/System【内置Per pin PMU】
  • Power UnitPPS - 1280Ch/System
  • PPS - 1280Ch/SystemLiquid cooing
  • Operating SystemLinux
거래처
DDR4,5 Component Full Function Test 및 DC Test 志愿
TOF Function 최대 200MHz Test (Cell & Core Test)
Per Site Operation Testing
Auto Calibration 志愿
Cycle Pallet All Pin 志愿