본문바로가기

Global Test Solution Provider

반도체 테스터의 국산화
주도해가겠습니다.

i2154
i2154

주요특징

  • High Power & High Productivity Burn-in test Solution
  • Embedded memory Tester with Burn-In system
  • Site Operation Testing (48 Slot / 480 BIB Density)

기본사양

  • Slot Count / Slot Pitch / Chamber 48EA / 40mm / 2Chamber
  • CapacityHOT : 7.5KW per Chamber
  • Temperature RangeRT~150℃
  • Temperature UniformityLess Than ±3℃
  • Frequency20MHz
  • Driver(A+S+C) / IO Driver392Ch
  • DPS Total360A per Slot
  • Max Para.24(X) x 20(Y) = 480Para
거래처
High Power & High Productivity Burn-in test Solution
Embedded memory Tester with Burn-In system
Site Operation Testing (48 Slot / 480 BIB Density)
i2300
i2300

주요특징

  • High Speed & High Accuracy Burn-in test Solution
  • Embedded memory Tester with Burn-In system
  • Site Operation Testing (48 Slot)
  • Fail Memory & RA Option (Internal / External 지원 가능)

기본사양

  • Slot Count / Slot Pitch / Chamber24EA / 40mm / 1Chamber
  • CapacityHOT & COLD : 7.5KW
  • Temperature Range-10℃ ~150℃
  • Temperature UniformityLess Than ±3℃
  • Frequency200MHz
  • Driver(A+S+C) / IO Driver1024Ch
  • DPS Total220A per Slot
  • Max Para20(X) x 16(Y) = 320Para @ 100Mhz↑
거래처
High Speed & High Accuracy Burn-in test Solution
Embedded memory Tester with Burn-In system
Site Operation Testing (48 Slot)
Fail Memory & RA Option (Internal / External 지원 가능)
TOP