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Global Test Solution Provider

We are ready to lead the way for the localization
of semiconductor testers.

SST 32K Series
SST 32K Series

Features

  • Multi-Protocol Capability : SAS 24G & PCIe Gen5 32G
  • Support for multiple different form factors: M.2, U.2/U.3, AIC, EDSFF
  • Stable temperature uniformity: ±3℃ @No-Load
  • iEOS, Advanced Tester Solution

Specifications

  • Temperature-60℃ ~ +150℃
  • -60℃ ~ +150℃240 Parallels
  • Chamber4chamber or 2chamber
  • DoorAutomatic Sliding or Manual Open/Close
  • Operating SystemLinux
거래처
Multi-Protocol Capability : SAS 24G & PCIe Gen5 32G
Support for multiple different form factors: M.2, U.2/U.3, AIC, EDSFF
Stable temperature uniformity: ±3℃ @No-Load
iEOS, Advanced Tester Solution
SST 12K / 24K Series
SST 12K / 24K Series

Features

  • Multi-Protocol Capability : SATA 6G, SAS 12G & PCIe Gen4 16G
  • Support for multiple different form factors: M.2, U.2/U.3, AIC, EDSFF
  • Stable temperature uniformity: ±3℃ @No-Load
  • iEOS, Advanced Tester Solution
  • Received the IR52 Jang Yeong-sil Award in 2018

Specifications

  • Temperature-10℃ ~ +85℃ (-60℃ ~ +150℃ for Automotive)
  • Parallelism240 Parallels
  • 240 Parallels4chamber or 2chamber
  • DoorAutomatic Sliding or Manual Open/Close
  • Operating SystemLinux
거래처
Multi-Protocol Capability : SATA 6G, SAS 12G & PCIe Gen4 16G
Support for multiple different form factors: M.2, U.2/U.3, AIC, EDSFF
Stable temperature uniformity: ±3℃ @No-Load
iEOS, Advanced Tester Solution
Received the IR52 Jang Yeong-sil Award in 2018