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Global Test Solution Provider

We are ready to lead the way for the localization
of semiconductor testers.

i1000 Series
i1000 Series

Features

  • DDR4,5 Module Full Function Test and DC Test Support
  • Available TOF function up to 200MHz(cell & core test)
  • Per Site Operation Testing
  • Auto Calibration Support
  • SPD Function Support
  • Cycle Pallet All Pin Support

Specifications

  • Test DeviceDDR4,5 Module / RDIMM, UDIMM, SODIMM
  • Max Frequency1200MHz/2400Mbps
  • Parallelism16para Multi-Site/Station
  • Digital Unit2944Ch/System [Built-in “Per pin” PMU]
  • Power UnitPPS - 640Ch/System, VPMIC - 16Ch/System (High Voltage & High Current)
  • Cooling MethodLiquid cooing
  • Operating SystemLinux
거래처
DDR4,5 Module Full Function Test and DC Test Support
Available TOF function up to 200MHz(cell & core test)
Per Site Operation Testing
Auto Calibration Support
SPD Function Support
Cycle Pallet All Pin Support
i7000 Series
i7000 Series

Features

  • DDR4,5 Component Full Function Test and DC Test Support
  • Available TOF function up to 200MHz(cell & core test)
  • Per Site Operation Testing
  • Auto Calibration Support
  • Cycle Pallet All Pin Support

Specifications

  • Test DeviceDDR4,5 Component
  • Max Frequency1200MHz/2400Mbps
  • Parallelism512para/Station
  • Digital Unit5888Ch/System [Built-in “per pin” PMU]
  • Power UnitPPS - 1280Ch/System
  • Cooling MethodLiquid cooing
  • Operating SystemLinux
거래처
DDR4,5 Component Full Function Test and DC Test Support
Available TOF function up to 200MHz(cell & core test)
Per Site Operation Testing
Auto Calibration Support
Cycle Pallet All Pin Support

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